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Technical documents for the MPQ1000

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Motor Analysis with the MPQ1000
Bearing failures are often blamed on poor lubrication. However, there are many other causes of bearing failures. Analyzing the failure cause can lead to higher motor reliability.
Published: 20 December 2018
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MPQ1000 Common Connections
An application note locoking at the common connections of the MPQ1000.
Published: 7 December 2018
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Fast Transient
Very fast transients have limited energy due to their short duration. They are caused by arcing faults, such as bad brushes in motors, and are rapidly damped out by even a few meters of distribution wiring.
Published: 7 December 2018
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Renaming test files on the MPQ units
An application note explaining how to rename test files on the MPQ test units. This feature can be used to keep track of recordings if the user has to record on multiple locations before downloading the data to a computer.
Published: 7 November 2018
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Measuring current on a CT secondary circuit
In some cases, measuring actual current on the primary conductor is not possible and the user may have to measure current on the secondary circuit of a CT. In this case, the MPQ can be programmed to display the actual primary current values instead of the current measured on the CT secondary circuit. This is done by following the steps given below.
Published: 6 November 2018
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Solar Energy - Part 2 of 3: Programming a PQ Analyzer
When examining potential power quality issues associated with solar panels, your power quality analyzer should be programmed to examine a variety of different parameters outlined in this application note.
Published: 3 July 2018
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Approved SD Cards for the MPQ Series
Different brands and types of SD Cards have different characteristics. This paper shows the recommended types to use with the MPQ series.
Published: 2 November 2017
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Common PQ issues: voltage sags and swells
This paper will define the various types of voltage sags and swells that occur and the effect they have on various types of equipment. It also describes methodologies to measure and locate these events that cause equipment malfunction and failures.
Published: 2 November 2017
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